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Overview

Inability of optical microscopes in imaging sizes smaller than wavelength of visible light resulted in invention of nanoscopes in the last decades. AFM is the top in the list due to its low price and multi-applications.

The basic principle of AFM

A spring micron size cantilever has a conical tip at its free end. The conical tip with a very sharp end, usually less than 10 nanometers, scans the sample surface from a very close nanometric distance.

As the tip moves over the surface the Van Der Waals forces between atoms on the sharp end of the tip and atoms on the surface of the samples varies, resulting vertical displacements of the cantilever.

Vertical movements of the cantilever are sensed by an optical method. The reflected laser beam from the cantilever backside hits a quadruple photodiode. The output signals of the photodiodes are related to the vertical movements of the cantilever which in turn represents the surface topography of the sample.

Nowadays AFM is the main tool in Nano research works. Apart from 3-dimensional nanoimaging, AFM is capable of determining various properties of the sample in nano scale. AFM could also perform nano-manipulations and nanolithography.

Features

Fly Kit
Pro Contact Kit
Experts Kit
Magnetic Force Microscopy (MFM)
Lateral Force Microscopy (LFM)
Chemical nano-lithography
Electric Force Microscopy (EFM)
Force spectroscopy
Force Modulation Microscopy (FMM)
Phase imaging
Mechanical nano-lithography
Conductive AFM (C-AFM)
Kelvin Probe Force Microscopy (KPFM)
PiezoResponse Force Microscopy (PFM)
Styled HTML Table
Scanner
XY scanner

20 – 70 μm maximum XY scan range

1 nm XY resolution

Z scanner

4 μm maximum Z movement range

0.1 nm Z resolution

Stage
XY stage

Motorized software-controlled

15 mm travel range

40 nm movement steps

Z stage

15 mm travel range

40 nm movement steps

Automatic engage of the cantilever to the sample surface (Auto Fast Approach)

Sample mount

20 mm maximum sample diameter/p>

10 mm maximum sample thickness

Includes light magnetic sample holder

-10 V to +10 V bias voltage range to the sample

Top View Optical Microscope

8-megapixel resolution, color

60X to 600X optical zoom

Integrated lighting

Include microscope diameter

Head

High precision adjustment micrometer

670 nm laser wavelength

5 mW maximum laser diode power

High grade quadruple photo-diode

Dithering mechanism

Optimized optical path design

Spring lever tip holder mechanism

Accessories

Sample mounting kit

The sample substrate

Various types of cantilevers

Tweezers and magnet box

Electronics
Plug and Play control box

ADC and DAC channels

4 channel ADC 24 bit

4 channel DAC 24 bit

Signal processing 40 MHz frequency zynq processor
Integrated functions 100 MB/sec via LAN
Software
Data acquisition

Real-time 100 MB/sec microsoft windows compatible

Integrated optical view windows for sample and cantilever vision

Minioring all system signals with a high rated oscilloscope

Auto saving captured images in software gallery

Scanning zoom-selected area on captured images

Automatic fast approach of cantilever to the sample surface (Auto fast Approach)

Image processing

Independent software for image processing, data analysis and presentation

Capability of exporting different data of images Built-in with all microsoft OS

Dedicated all in one (AIO) computer

21" Display monitor: 1920*1080 resolution

The latest generation of processors

8 GB RAM

AFM unit (Plug and Play)
Dimension

300 mm * 400 mm * 300 mm

Net weight 20 Kg
Options
XY Scanner Possibility to customize the XY scan range to 100 μm
Tip changing kit Vacuum pen