Overview
Inability of optical microscopes in imaging sizes smaller than wavelength of visible light resulted in invention of nanoscopes in the last decades. AFM is the top in the list due to its low price and multi-applications.
The basic principle of AFM
A spring micron size cantilever has a conical tip at its free end. The conical tip with a very sharp end, usually less than 10 nanometers, scans the sample surface from a very close nanometric distance.
As the tip moves over the surface the Van Der Waals forces between atoms on the sharp end of the tip and atoms on the surface of the samples varies, resulting vertical displacements of the cantilever.
Vertical movements of the cantilever are sensed by an optical method. The reflected laser beam from the cantilever backside hits a quadruple photodiode. The output signals of the photodiodes are related to the vertical movements of the cantilever which in turn represents the surface topography of the sample.
Nowadays AFM is the main tool in Nano research works. Apart from 3-dimensional nanoimaging, AFM is capable of determining various properties of the sample in nano scale. AFM could also perform nano-manipulations and nanolithography.
Features
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Simplified procedure for nano-imaging:
Simplification in operation together with reducing the required time for nano-imaging has made Brisk extremely user friendly.
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Developed tip fixing procedure:
You can calmly fix the tip in AFM-head in the shortest possible time.
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High magnification OM:
The initial imaging for choosing the scan point is performed using a powerful OM fixed on the machine.
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Adopted with all computer types:
PCs, Laptops, all-in-one or any other computer types can be used with Brisk
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New generation of the controller:
Employing the latest advanced electronics in Brisk has improved the controller functioning.
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LAN feature:
One single network cable does all data transfer between computer and the machine.
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Fast Approach:
Saving time during approach by using fast approach technique is a marvelous feature of Brisk.
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Fantastic design, compact:
Brisk occupies least possible space in your laboratory and its nice looking view attracts the users.
Fly Kit | Pro Contact Kit | Experts Kit |
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Magnetic Force Microscopy (MFM) | Lateral Force Microscopy (LFM) | Chemical nano-lithography |
Electric Force Microscopy (EFM) | Force spectroscopy | Force Modulation Microscopy (FMM) |
Phase imaging | Mechanical nano-lithography | Conductive AFM (C-AFM) |
Kelvin Probe Force Microscopy (KPFM) | ||
PiezoResponse Force Microscopy (PFM) |
Scanner | |
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XY scanner |
20 – 70 μm maximum XY scan range 1 nm XY resolution |
Z scanner |
4 μm maximum Z movement range 0.1 nm Z resolution |
Stage | |
XY stage |
Motorized software-controlled 15 mm travel range 40 nm movement steps |
Z stage |
15 mm travel range 40 nm movement steps Automatic engage of the cantilever to the sample surface (Auto Fast Approach) |
Sample mount | |
20 mm maximum sample diameter/p> 10 mm maximum sample thickness Includes light magnetic sample holder -10 V to +10 V bias voltage range to the sample |
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Top View Optical Microscope | |
8-megapixel resolution, color 60X to 600X optical zoom Integrated lighting Include microscope diameter |
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Head | |
High precision adjustment micrometer 670 nm laser wavelength 5 mW maximum laser diode power High grade quadruple photo-diode Dithering mechanism Optimized optical path design Spring lever tip holder mechanism |
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Accessories | |
Sample mounting kit The sample substrate Various types of cantilevers Tweezers and magnet box |
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Electronics | |
Plug and Play control box |
ADC and DAC channels 4 channel ADC 24 bit 4 channel DAC 24 bit |
Signal processing | 40 MHz frequency zynq processor |
Integrated functions | 100 MB/sec via LAN |
Software | |
Data acquisition |
Real-time 100 MB/sec microsoft windows compatible Integrated optical view windows for sample and cantilever vision Minioring all system signals with a high rated oscilloscope Auto saving captured images in software gallery Scanning zoom-selected area on captured images Automatic fast approach of cantilever to the sample surface (Auto fast Approach) |
Image processing |
Independent software for image processing, data analysis and presentation Capability of exporting different data of images Built-in with all microsoft OS |
Dedicated all in one (AIO) computer | |
21" Display monitor: 1920*1080 resolution The latest generation of processors 8 GB RAM |
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AFM unit (Plug and Play) | |
Dimension |
300 mm * 400 mm * 300 mm |
Net weight | 20 Kg |
Options | |
XY Scanner | Possibility to customize the XY scan range to 100 μm |
Tip changing kit | Vacuum pen |